专利名称：Measurement device control system for
determining a topology of a surface of abulk material
发明人：Roland WELLE,Josef FEHRENBACH申请号：US14781225申请日：20140508
公开号：US20160054167A1公开日：20160225
专利附图：
摘要：For determining the topology of a bulk material surface, a series of echo curvesare detected in different primary radiation directions of the antenna. In the process, theprimary radiation direction of the antenna is changed in such a way that all of thegenerated echo curves of the series of echo curves can be used for determining thetopology of the bulk material surface. As a result, the measurement time can be reduced.
申请人：VEGA GRIESHABER KG
地址：Wolfach DE
国籍：DE
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