专利名称：DISPLACEMENT/DISTORTION MEASURING
METHOD AND
DISPLACEMENT/DISTORTION MEASURINGAPPARATUS
发明人：MATSUDA, Hiroshi,UCHINO, Masakazu,ITO,
Yukihiro,YOSHIMARU, Kousuke,YAMAZAKI,Chikara,YAMAZAKI, Shuichi,UCHIDA,Kousuke
申请号：EP06842996.8申请日：20061221公开号：EP1972885A1公开日：20080924
专利附图：
摘要：The present invention provides a displacement/strain measuring method andapparatus capable of measuring a displacement or strain of an object easily and with ahigh precision. The invention captures an image of a surface of a to-be-measured objectimaged by a line scanner apparatus set in close adhesion or in vicinity of the surface ofthe to-be-measured object, measures displacement or strain through an image analysisfrom an image of the surface of the to-be-measured object before time elapse and animage of the surface of the to-be-measured object after time elapse, and outputs aresult of measuring the displacement or strain.
申请人：Nagasaki University National University Corporatioin,SAGA UNIVERSITY
地址：1-14, Bunkyo-machi Nagasaki-shi, Nagasaki, 852-8521 JP,1 Honjo-machi Saga-ShiSaga 840-8502 JP
国籍：JP,JP
代理机构：Epping - Hermann - Fischer
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